FURUKAWA CO., LTD.
Patent Owner
Stats
- 27 US PATENTS IN FORCE
- 3 US APPLICATIONS PENDING
- Feb 08, 2018 most recent publication
Details
- 27 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 650 Total Citation Count
- Aug 05, 1985 Earliest Filing
- 21 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
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Recent Publications
Publication #
Title
Filing Date
Pub Date
Intl Class
2018/0036,981 DEVICE AND METHOD FOR EVALUATING OPERATING CONDITIONS OF BRIQUETTING MACHINE, BRIQUETTING MACHINE, METHOD FOR MANUFACTURING BRIQUETTE, CONTROL DEVICE OF BRIQUETTING MACHINE, CONTROL METHOD OF BRIQUETTING MACHINE, AND PROGRAMOct 21, 15Feb 08, 18[B30B]
2017/0279,025 THERMOELECTRIC CONVERSION MATERIAL, METHOD OF MANUFACTURING THERMOELECTRIC CONVERSION MATERIAL, AND THERMOELECTRIC CONVERSION MODULESep 09, 15Sep 28, 17[H01L]
2014/0144,381 METHOD FOR WASHING SEMICONDUCTOR MANUFACTURING APPARATUS COMPONENT, APPARATUS FOR WASHING SEMICONDUCTOR MANUFACTURING APPARATUS COMPONENT, AND VAPOR PHASE GROWTH APPARATUSMar 15, 12May 29, 14[H01L]
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
9834858 Pr-containing scintillator single crystal, method of manufacturing the same, radiation detector, and inspection apparatusNov 07, 05Dec 05, 17[C09K, G21K, C01F, C30B, G01T]
9372215 Electrical resistance measurement apparatus and electrical resistance measurement methodMar 06, 13Jun 21, 16[G01N, G01R]
9140636 Briquette inspection device and briquette inspection method for measuring weight, volume, and crush strengthNov 25, 13Sep 22, 15[G01N, G01B]
8969812 Garnet-type crystal for scintillator and radiation detector using the sameJan 27, 12Mar 03, 15[C09K, G21K, G01T]
8619243 Mobility measuring apparatus, method therefor, and resistivity measuring apparatus and method thereforAug 31, 10Dec 31, 13[H01L, G01J]
8445852 Signal light detection device and method of detecting signal lightJun 11, 10May 21, 13[G01T]
8446576 Carrier concentration measuring device and carrier concentration measuring methodDec 11, 08May 21, 13[G01J]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2008/0261,378 Method for Growth of Gan Single Crystal, Method for Preparation of Gan Substrate, Process for Producing Gan-Based Element, and Gan-Based ElementAbandonedMar 31, 06Oct 23, 08[H01L]
2006/0231,174 Method for producing high-strength superplastic materialAbandonedMay 28, 04Oct 19, 06[C22F, C21D]
6937009 Rotation sensor and displacement detecting apparatus and method utilizing the sameExpiredJun 20, 03Aug 30, 05[G01B]
5358060 Successive hole boring machine and lost strike preventing device for successive hole boring machineExpiredJun 16, 93Oct 25, 94[E21B]
4929572 Dopant of arsenic, method for the preparation thereof and method for doping of semiconductor therewithExpiredJul 17, 89May 29, 90[H01L]
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